Spectrophotometer and Software, UV-Vis, Perkin Elmer Lambda 25, Refurbished

Spectrophotometer and Software, UV-Vis, Perkin Elmer Lambda 25, Refurbished

CAD $4,500.00

Spectrophotometer, UV-Vis, Perkin Elmer Lambda 25 along with control software package, Refurbished

Wavelength range 190-1100 nm

1 in stock

CAD $4,500.00

1 in stock

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Spectrophotometer, UV-Vis, Perkin Elmer Lambda 25, Refurbished

PerkinElmer LAMBDA 25
PerkinElmer’s LAMBDA 25/35/45 UV/Vis systems are easy to operate and deliver trustworthy results with the minimum of operator training. With over 12,000 units installed worldwide, this superior technology and proven build quality have proven itself under the toughest conditions. With extensive suite of Instrument Performance Verification (IPV) tests confirms high-quality performance over the lifetime of the system, and for regulated industries, the Enhanced Security (ES) version of UV WinLab integrates seamless 21CFR part 11 technical compliance.

For fast and reliable results time after time, choose the LAMBDA 25 for routine UV/Vis applications, pharmacopeia and regulatory tests and liquids analysis. The comprehensive range of operating modes provides trustworthy results for a range of analyses including quantitative measurements and kinetics studies.

For fast and reliable results time after time, choose the LAMBDA 25 for routine UV/Vis applications, pharmacopoeia and regulatory tests and liquids analysis. A comprehensive range of operating modes provides trustworthy results for a range of analyses including quantitative measurements and kinetics studies.

SPECIFICATIONS
Bandwidth 1 nm fixed
Stray light At 220 nm (NaI) < 0.01%T
At 340 nm (NaNO2) < 0.01%T
At 370 nm (NaNO2) < 0.01%T
At 200 nm (KCl) < 1%T
Wavelength accuracy At D2 peak (656.1 nm) ±0.1 nm
Wavelength reproducibility 10 measurements at 656.1 nm ±0.05 nm
Photometric accuracy At 1A using NIST 930D filter ±0.001 A
At 2A using NIST 1930D filter ±0.005 A
Potassium dichromate ±0.010 A
Photometric Maximum deviation of reproducibility 10 measurements at 1 A < 0.001 A
Photometric stability Stability at 1 A, at 500 nm < 0.00015 with 2-sec. response time A/hour
Photometric noise Noise 500 nm/0 A RMS < 0.00005 A at 500 nm (RMS) Slit 1 nm
Baseline flatness Slit 1 nm ±0.001 A

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